Semiparametric estimation of the accelerated mean model with panel count data under informative examination times
Biometrics, EarlyView. (Source: Biometrics)
Source: Biometrics - December 29, 2017 Category: Biotechnology Source Type: research
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Biometrics, Ahead of Print. (Source: Biometrics)
Source: Biometrics - December 29, 2017 Category: Biotechnology Source Type: research
Semiparametric estimation of the accelerated mean model with panel count data under informative examination times
Summary
Panel count data arise when the number of recurrent events experienced by each subject is observed intermittently at discrete examination times. The examination time process can be informative about the underlying recurrent event process even after conditioning on covariates. We consider a semiparametric accelerated mean model for the recurrent event process and allow the two processes to be correlated through a shared frailty. The regression parameters have a simple marginal interpretation of modifying the time scale of the cumulative mean function of the event process. A novel estimation procedure for the regress...
Source: Biometrics - December 29, 2017 Category: Biotechnology Authors: Sy Han Chiou, Gongjun Xu, Jun Yan, Chiung ‐Yu Huang Tags: ORIGINAL ARTICLE Source Type: research
Acknowledgements
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