Oxygen related defects and vacancy clusters identified in sputtering grown UOx thin films by positron annihilation techniques

Publication date: Available online 6 July 2021Source: Results in PhysicsAuthor(s): C. Macchi, A. Somoza, J. Guimpel, S. Suárez, W. Egger, C. Hugenschmidt, S. Mariazzi, R.S. Brusa

Source: Results in Physics - July 7, 2021 Category: Physics Source Type: research