Preferential growth characteristics and ferroelectric properties of epitaxial SrBi2Nb2O9 thin films along the a-axis direction due to the misfit strains

Publication date: 1 November 2021Source: Materials Science in Semiconductor Processing, Volume 134Author(s): Hyun Wook Shin, Jong Yeog Son
Source: Materials Science in Semiconductor Processing - Category: Materials Science Source Type: research