Impact of ion implantation on stacked oxide cylindrical gate junctionless accumulation mode MOSFET: An electrical and circuit level analysis

Publication date: October 2021Source: Materials Science in Semiconductor Processing, Volume 133Author(s): Kamalaksha Baral, Prince Kumar Singh, Gautam Kumar, Ashish Kumar Singh, Manas Ranjan Tripathy, Sanjay Kumar, Satyabrata Jit
Source: Materials Science in Semiconductor Processing - Category: Materials Science Source Type: research