Effects of deep-level traps on the transport properties of high-flux X-ray CdZnTe detectors

Publication date: October 2021Source: Materials Science in Semiconductor Processing, Volume 133Author(s): Yingrui Li, Gangqiang Zha, Yu Guo, Shouzhi Xi, Lingyan Xu, Hui Yu, Wanqi Jie
Source: Materials Science in Semiconductor Processing - Category: Materials Science Source Type: research