Electrical study of ZnO film thickness effect on the evolution of interface potential barrier of ZnO/p-Si heterojunction: Contribution to transport phenomena study

Publication date: October 2021Source: Materials Science in Semiconductor Processing, Volume 133Author(s): L. Chabane, N. Zebbar, M. Trari, Y.H. Seba, M. Kechouane
Source: Materials Science in Semiconductor Processing - Category: Materials Science Source Type: research