Evidence of weak-antilocalization phenomenon in Al-induced crystallization grown polycrystalline-SiGe thin film

Publication date: Available online 2 June 2021Source: Materials LettersAuthor(s): Twisha Sain, Ch. Kishan Singh, E.P. Amaladass, S. Abhirami, S. Ilango, T. Mathews, Awadhesh Mani
Source: Materials Letters - Category: Materials Science Source Type: research