Ovonic threshold switching induced local atomic displacements in amorphous Ge60Se40 film probed via in situ EXAFS under DC electric field

Publication date: 15 September 2021Source: Journal of Non-Crystalline Solids, Volume 568Author(s): Sang Yeol Shin, Hyun Kim, Roman Golovchak, Byung-ki Cheong, Himanshu Jain, Yong Gyu Choi
Source: Journal of Non Crystalline Solids - Category: Chemistry Source Type: research
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