Pronounced electromigration of GaInSn/Cu interconnects under super low critical current density

Publication date: Available online 28 May 2021Source: Materials LettersAuthor(s): Zhaoqing Gao, Chong Dong, Shengyan Shang, Mingliang Huang, Haitao Ma, Yunpeng Wang
Source: Materials Letters - Category: Materials Science Source Type: research