Residual-based pattern center calibration in high-resolution electron backscatter diffraction

Publication date: Available online 26 April 2021Source: MicronAuthor(s): Hongru Zhong, Qiwei Shi, Zhe Chen, Chengyi Dan, Shengyi Zhong, Haowei Wang

Source: Micron - April 27, 2021 Category: Biology Source Type: research