A method of using Si L-edge for O/Si and N/Si quantitative ratio analysis by electron energy loss spectroscopy (EELS)

Publication date: Available online 20 April 2021Source: MicronAuthor(s): Yun-Yu Wang, Sook Fun Chan, Qiang Jin, Kent Zhuang, Jae Kyu Choi

Source: Micron - April 21, 2021 Category: Biology Source Type: research