Enhancement of defects induced optical nonlinearity in Al: ZnO thin films by electron beam

Publication date: 15 June 2021Source: Materials Science in Semiconductor Processing, Volume 128Author(s): Albin Antony, Poornesh P, J. Jedryka, K. Ozga, Gopalkrishna Hegde, Suresh D. Kulkarni, Vikash Chandra Petwal, Vijay Pal Verma, Jishnu Dwivedi
Source: Materials Science in Semiconductor Processing - Category: Materials Science Source Type: research