A High Angle Scattering, Stable Amorphous Metal TEM Specimen for Measuring the Information Envelop of Electron Microscopes

Publication date: Available online 19 November 2019Source: MicronAuthor(s): Rodney A. HerringAbstractAn amorphous metal (a-metal) TEM specimen suitable for measuring the information envelop of (S)TEM electron microscopes is presented. Its features include producing high angle electron scattering intensities and having good structural stability compared with commonly used specimens of amorphous carbon (a-C) and Au islands supported on a-C substrate.

Source: Micron - November 20, 2019 Category: Biology Source Type: research