Transmission Kikuchi diffraction in a scanning electron microscope: A review

Publication date: December 2016 Source:Materials Science and Engineering: R: Reports, Volume 110 Author(s): Glenn C. Sneddon, Patrick W. Trimby, Julie M. Cairney Transmission Kikuchi diffraction (TKD), also known as transmission electron backscatter diffraction (t-EBSD), has received significant interest for the characterisation of nanocrystalline materials and nanostructures. In this paper, we will review the development of TKD, including forescatter detector imaging and ongoing parameter optimisation, as well as some of the current applications of the technique. A comparison to other microanalysis techniques is also included, highlighting their relative strengths and weaknesses and their complementarity with TKD. Finally, potential applications of the technique and possible future developments are discussed.
Source: Materials Science and Engineering: R: Reports - Category: Materials Science Source Type: research