Fabrication of sharp atomic force microscope probes using in situ local electric field induced deposition under ambient conditions

We demonstrate a simple method to significantly improve the sharpness of standardsilicon probes for anatomic force microscope or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localizedelectric field in the air gap between the probe tip and thesurface of conductive sample. Under these conditions, nanostructure growth takes place on both the sample and the tip. The most likely mechanism is the decomposition of atmosphericadsorbate with subsequent deposition ofcarbon structures. This makes it possible to grow a spike of a few hundred nanometers in length on the tip. We further demonstrate that probes obtained by this method can be used for high-resolution scanning. It is important to note that all process operations are carried outin situ, in air and do not require the use of closed chambers or any additional equipment beyond theatomic force microscope itself.
Source: Review of Scientific Instruments - Category: Physics Authors: Source Type: research