A new setup for high resolution fast X-ray reflectivity data acquisition

A new method for fastx-rayreflectivitydata acquisition is presented. The method is based on a fast rotating, slightly tilted sample reflecting to a stationary mountedposition sensitive detector and it allows for measurements ofreflectivity curves in a quarter of a second. The resolution in q-space mainly depends on the beam properties and the pixel size of thedetector. Maximum qz-value of 1 Å−1 can be achieved. The time-temperature dependingstructure changes of poly(N-isopropylacrylamide)thin films were investigatedin situ by applying the fast-reflectivity setup. The results are presented in this paper as illustration of the method and proof of principle.

Source: Review of Scientific Instruments - November 11, 2016 Category: Physics Authors: Milena Lippmann, Adeline Buffet, Kathrin Pflaum, Anita Ehnes, Anca Ciobanu and Oliver H. Seeck Source Type: research