Towards 10 meV resolution: The design of an ultrahigh resolution soft X-ray RIXS spectrometer

We present the optical design of the Centurionsoft X-ray resonant inelastic X-ray scattering (RIXS)spectrometer to be located on the SIX beamline at NSLS-II. Thespectrometer is designed to reach a resolving power of 100  000 at 1000 eV at its best resolution. It is also designed to have continuously variable 2θ motion over a range of 112 ° using a custom triple rotating flange. We have analyzed several possiblespectrometer designs capable of reaching the target resolution. After careful analysis, we have adopted a Hettrick-Underwoodspectrometer design, with an additional planemirror to maintain a fixed direction for the outgoing beam. Thespectrometer can cancel defocus and comaaberrations at all energies, has an erectfocal plane, and minimizes mechanical motions of thedetector. When the beamline resolution is accounted for, the net spectral resolution will be 14 meV at 1000 eV. This will open up many low energy excitations to study and will expand greatly the power ofsoft X-ray RIXS.

Source: Review of Scientific Instruments - November 10, 2016 Category: Physics Authors: Joseph Dvorak, Ignace Jarrige, Valentina Bisogni, Scott Coburn and William Leonhardt Source Type: research