A comparison of “flat fielding” techniques for x-ray framing cameras

Gain can vary across the active area of anx-ray framingcamera by a factor of 4 (or more!) due to the voltage loss and dispersion associated with pulse transmission in a microstripline-coated microchannel plate. In order to make quantitative measurements, it is consequently important to measure the gain variation ( “flat field”). Moreover, because of electromagnetic cross talk, gain variation depends on specific operational parameters, and ideally a flat field would be obtained at all operating conditions. As part of a collaboration between Lawrence Livermore National Laboratory’s National Ignition Facil ity and the Commissariat à l’Énergie Atomique, we have been able to evaluate the consistency of three different methods of measuringx-ray flat fields. By applying all three methods to a singlecamera, we are able to isolate performance from method. Here we report the consistency of the methods and discuss systematic issues with the implementation andanalysis of each.

Source: Review of Scientific Instruments - September 28, 2016 Category: Physics Authors: L. R. Benedetti, C. Trosseille, J. P. Holder, K. Piston, D. Hargrove, D. K. Bradley, P. Bell, J. Raimbourg, M. Prat, L. A. Pickworth and S. F. Khan Source Type: research