Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces

In this study, we developed a low-temperature, frequency-modulationAFM using an optical beam deflectionsystem to simultaneously measure the vertical and lateral forces. In thissystem, the heat sources, such as alaser diode and a current-to-voltage converter, for measuring the photocurrent of the four-segmentedphotodiode are located outside the observation chamber to avoid a temperature increase of theAFM unit. The focused optical beam is three-dimensionally adjustable on the back side of the cantilever. We demonstrate low-noise displacement measurement of the cantilever and successful atomic resolutionimaging using the vertical and lateral forces atlow temperatures.

Source: Review of Scientific Instruments - September 27, 2016 Category: Physics Authors: Eiji Arima, Huanfei Wen, Yoshitaka Naitoh, Yan Jun Li and Yasuhiro Sugawara Source Type: research